Andrew Murphy, The University of Texas at Austin

"Investigating Physics at the Surface with Scanning Probe Microscopy"

Abstract: Since its conception four decades ago, scanning probe microscopy (SPM) has been a powerful experimental tool in investigating the physics at the surface of materials. Through the careful choice of a particular probe method, we may measure the topographic, electronic, or magnetic properties of the surface of a variety of materials. A material class that has gained much attention in the past two decades is that of topological materials. In this talk, I will present the fundamentals of several SPM methods, and their applications to investigating topological materials.